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    400-850-4050

    Nondestructive testing (Electronic Products & Components)

     

    X-Ray C-SAM

     

    Brief introduction:

    Nondestructive testing refers to the method makes use of internal structure abnormalities or defects causing the change of heat, sound, light, electricity, magnetic, etc to inspect and test the specimen surface and internal structure, properties, status and defect types, quantity, size, shape, position under under the premise of without harming the use performance and internal organization of detected objects. By measuring these changes to understand and evaluate the detected materials, and the nature of the device components, status, quality or internal structure etc.

     

    Applications

    Cars, PCB & PCBA, FPC, electronic appliances, electronics components, plastic materials, metal materials, medical equipment, research institutes, aerospace, military and defense etc.

     

    Sample requirements:

    X-ray: Not more than 300mmx300mm

    C-sam: No specific requirements

    CT: General requirements for sample size no greater than 50mmx50mm.



    • Contact Us
    • MTT Shenzhen

      Tel: 400-850-4050

      Fax: 0755-2782 1672

      Email: marketing@25rp.com

       

      MTT Suzhou

      Tel: 400-118-1002

      Fax: 0512-6275 9537

      Email: marketing@25rp.com

       

      MTT Shanghai

      Tel: 400-118-1002

      Email: marketing@25rp.com

       

      MTT Dongguan

      Tel: 400-116-1002

      Email:marketing@25rp.com

    Shenzhen Meixin Testing Technology Co., Ltd.

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